Regularization: A stable and accurate method for generating depth profiles from angle-dependent XPS data-Reference-Cited by-同舟云学术

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Regularization: A stable and accurate method for generating depth profiles from angle-dependent XPS data

Published:1989-08 Issue:8 Volume:14 Page:443-450
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Tyler B. J.,Castner D. G.,Ratner B. D.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference27 articles.

1. Surface sensitivity and angular dependence of X-ray photoelectron spectra

2. Determination of Depth Profiles by Angular Dependent X-Ray Photoelectron Spectra

3. Deconvolution of concentration depth profiles from angle resolved x‐ray photoelectron spectroscopy data

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