A procedure for the extraction of a nonlinear microwave GaN FET model

Author:

Avolio Gustavo1,Vadalà Valeria2,Angelov Iltcho3,Raffo Antonio2,Marchetti Mauro4,Vannini Giorgio2,Schreurs Dominique1

Affiliation:

1. KU Leuven; Department ESAT-TELEMIC; Kasteelpark Arenberg 10 3001 Heverlee Belgium

2. University of Ferrara; Dipartimento di Ingegneria; via G. Saragat 1 44122 Ferrara Italy

3. Chalmers University of Technology; Göteborg Sweden

4. Anteverta-mw B.V.; Maury Microwave Company; Delft The Netherlands

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Computer Science Applications,Modelling and Simulation

Reference47 articles.

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2. Calibrated vectorial nonlinear-network analyzers;Van den Broek;IEEE MTTS Int Microw Symp Dig,1994

3. 40 GHz/150-ns versatile pulsed measurement system for microwave transistor isothermal characterization;Teyssier;IEEE Trans Microwave Theory Tech,1998

4. A. E. Parker J. G. Rathmell Measurement and Characterisation of HEMT Dynamics Asia-Pacific Microwave Conference Proceedings 2000 846 849 Sydney Australia

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