Experimental insight into the temperature effects on DC and microwave characteristics for a GaAs pHEMT in multilayer 3‐D MMIC technology-Reference-Cited by-同舟云学术

Experimental insight into the temperature effects on DC and microwave characteristics for a GaAs pHEMT in multilayer 3‐D MMIC technology

Published:2020-08-03 Issue:10 Volume:30 Page:
ISSN:1096-4290
Container-title:International Journal of RF and Microwave Computer-Aided Engineering
language:en
Short-container-title:Int J RF Microw Comput Aided Eng

Author:

Alim Mohammad Abdul¹^ORCID,Rezazadeh Ali A.²,Crupi Giovanni³^ORCID

Affiliation:

1. Department of Electrical and Electronic EngineeringUniversity of Chittagong Chittagong Bangladesh

2. Former professor of the School of Electrical and Electronic EngineeringThe University of Manchester Manchester UK

3. Department of Biomedical and Dental Sciences and Morphofunctional ImagingUniversity of Messina Messina Italy

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Computer Science Applications

Link

Reference61 articles.

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

2. Measurement and Modeling of GaAs Based Nano-pHEMT: Small Signal to Large Signal Analysis;2023 International Conference on Electrical, Computer and Communication Engineering (ECCE);2023-02-23