NanoSIMS imaging alteration layers of a leached SON68 glass via a FIB-made wedged crater-Reference-Cited by-同舟云学术

NanoSIMS imaging alteration layers of a leached SON68 glass via a FIB-made wedged crater

Author:

Wang Yi-Chung¹²,Schreiber Daniel K.³,Neeway James J.³,Thevuthasan Suntharampillai¹,Evans James E.¹,Ryan Joseph V.³,Zhu Zihua¹,Wei Wei David²

Affiliation:

1. W. R. Wiley Environmental Molecular Sciences Laboratory; Pacific Northwest National Laboratory; Richland WA 99354 USA

2. Department of Chemistry and Center for Nanostructured Electronic Materials; University of Florida; Gainesville FL 32611 USA

3. Energy and Environment Directorate; Pacific Northwest National Laboratory; Richland WA 99354 USA

Funder

U.S. Department of Energy

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

Reference12 articles.

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2. NanoSIMS Imaging and Analysis in Materials Science;Annual Review of Analytical Chemistry;2020-06-12