Depth profiling of polycrystalline layers under a surface using x-ray diffraction at small glancing angle of incidence
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference8 articles.
1. Anomalous Surface Reflection of X Rays
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2. Improved formulae for X-ray Reflectivity;Transactions of the Materials Research Society of Japan;2015
3. X-ray diffraction methods for diagnostics of surface and nanolayers of crystalline structures (review);Inorganic Materials;2014-11-25
4. Improvement of surface and interface roughness estimation on X-ray reflectivity;Powder Diffraction;2014-04-29
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