Molecular depth profiling of polymers with very low energy reactive ions
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference17 articles.
1. Etching rate and structural modification of polymer films during low energy ion irradiation
2. Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry
3. Molecular Depth Profiling with Cluster Ion Beams
4. Temperature-controlled depth profiling in polymeric materials using cluster secondary ion mass spectrometry (SIMS)
5. Molecular depth-profiling of polycarbonate with low-energy Cs+ ions
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