Measuring surface state density and energy distribution in InAs nanowires-Reference-Cited by-同舟云学术

Measuring surface state density and energy distribution in InAs nanowires

Published:2014-01-28 Issue:2 Volume:211 Page:473-482
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:Phys. Status Solidi A

Author:

Halpern Eliezer¹,Cohen Gilad¹,Gross Shahar¹,Henning Alexander¹,Matok Max¹,Kretinin Andrey V.²,Shtrikman Hadas³,Rosenwaks Yossi¹

Affiliation:

1. Department of Physical Electronics; School of Electrical Engineering; Tel-Aviv University; Tel-Aviv Israel

2. School of Physics and Astronomy; University of Manchester; Oxford Rd. Manchester M13 9PL UK

3. Department of Condensed Matter Physics; Braun Center for Submicrometer Research; Weizmann Institute of Science; Rehovot 76100 Israel

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/pssa.201300302/fullpdf

Reference41 articles.

1. Capacitance–voltage measurement and modeling on a nanometer scale by scanning C–V microscopy

2. Scanning capacitance characterization of potential screening in InAs nanowire devices

3. Measuring the Capacitance of Individual Semiconductor Nanowires for Carrier Mobility Assessment

4. Dopant profiling and surface analysis of silicon nanowires using capacitance–voltage measurements

5. Nanowire Nanosensors for Highly Sensitive and Selective Detection of Biological and Chemical Species

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