The Role of Nanoparticles on Topographic Cross‐Talk in Electric Force Microscopy and Magnetic Force Microscopy-Reference-Cited by-同舟云学术

The Role of Nanoparticles on Topographic Cross‐Talk in Electric Force Microscopy and Magnetic Force Microscopy

Published:2020-01-14 Issue:13 Volume:217 Page:1900828
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:Phys. Status Solidi A

Author:

Fuhrmann Marc¹^ORCID,Krivcov Alexander¹^ORCID,Musyanovych Anna²,Thoelen Ronald³^ORCID,Möbius Hildegard¹^ORCID

Affiliation:

1. Department of Computer Sciences/Micro Systems Technology University of Applied Sciences Kaiserslautern Amerikastr. 1 66482 Zweibrücken Germany

2. Nanoparticle Technology Department Fraunhofer IMM Carl-Zeiss-Str. 18-20 55129 Mainz Germany

3. Institute for Materials Research Hasselt University Martelarenlaan 42 3500 Hasselt Belgium

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssa.201900828

Reference22 articles.

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4. Extended model for the interaction of dielectric thin films with an electrostatic force microscope probe

5. Fluorescence-Modified Superparamagnetic Nanoparticles: Intracellular Uptake and Use in Cellular Imaging

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