Extended model for the interaction of dielectric thin films with an electrostatic force microscope probe
Author:
Affiliation:
1. CNR-IPCF, UOS Pisa, Largo Pontecorvo 3, I-56127 Pisa, Italy
2. Physics Department, University of Pisa, Largo Pontecorvo 3, I-56127 Pisa, Italy
3. Chemistry Division, Naval Research Laboratory, Washington, D.C., USA 20375-5342
Funder
Italian Foreign Affairs Ministry - DGPSP
Office of Naval Research (ONR)
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4937136
Reference28 articles.
1. Nanostructures and Nanomaterials
2. Fabrication of high-density arrays of individually isolated nanocapacitors using anodic aluminum oxide templates and carbon nanotubes
3. High‐resolution capacitance measurement and potentiometry by force microscopy
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5. Accuracy and resolution limits of Kelvin probe force microscopy
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