Modeling and analyzing semiconductor yield with generalized linear mixed models
Author:
Affiliation:
1. Kansas State University; Manhattan KS U.S.A.
2. School of Computing, Informatics & Decision Systems Engineering; Arizona State University; Mail Code: 8809 Tempe AZ 85287 U.S.A.
Funder
National Science Foundation
Publisher
Wiley
Subject
Management Science and Operations Research,General Business, Management and Accounting,Modelling and Simulation
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/asmb.2074/fullpdf
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4. Determining the target value of ACICD to optimize the electrical characteristics of semiconductors using dual response surface optimization;Lee;Applied Stochastic Models in Business and Industry,2013
5. Mixed response surface models and Bayesian analysis of variance components for electrically conductive adhesives;Berni;Applied Stochastic Models in Business and Industry,2013
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