1. (1992) Topographic kinetics and practice of low-angle ion beam thinning. In: Specimen Preparation for TEM of Materials. IAII. Mat. Res. Soc. Symp. Proc. Vol. 254. R. Anderson, B. Tracy, and J. Bravman, eds. pp. 3-22.
2. (1966) Introduction to Electron Microscopy, McGraw-Hill, New York, pp. 278-367.
3. Mat. Res. Soc. Proc. Vol. 115 (1988) Specimen preparation for transmission electron microscopy of materials. and eds. Materials Research Society, Pittsburgh, PA.
4. Mat. Res. Soc. Proc. Vol. 199 (1990) Specimen preparation for transmission electron microscopy of materials. II. ed., Materials Research Society, Pittsburgh, PA.
5. Mat. Res. Soc. Proc. Vol. 254 (1992) Specimen preparation for transmission electron microscopy of materials. III. and eds. Materials Research Society, Pittsburgh, PA.