Evolution of a notched surface under glancing-angle broad ion beam erosion-Reference-Cited by-同舟云学术

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Evolution of a notched surface under glancing-angle broad ion beam erosion

Published:2021-12 Issue: Volume:509 Page:12-20
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Busch Richard^ORCID,Krause Michael^ORCID,Höche Thomas^ORCID

Funder

Deutsche Forschungsgemeinschaft

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference23 articles.

1. Topographic kinetics and practice of low angle ion beam thinning;Barna,1991

2. Preparation of cross-sectional TEM samples for low-angle ion milling;McCaffrey;Microsc. Res. Tech.,1997

3. Cross-sectional sample preparation by focused ion beam: A review of ion-sample interaction;Ishitani;Microsc. Res. Tech.,1996

4. Applications of the FIB lift-out technique for TEM specimen preparation;Giannuzzi;Microsc. Res. Tech.,1998

5. Eutectic solidification in hypoeutectic Al–Si alloys: electron backscatter diffraction analysis;Nogita;Mater. Charact.,2001

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Laser‐based sample preparation for high‐resolution X‐ray‐computed tomography of glasses and glass ceramics;Journal of Microscopy;2022-10-26

2. Advanced Large Area Sample Preparation for Electron Microscopy using Initial Notches;Microscopy and Microanalysis;2022-08-01

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