Regular Dislocation Networks in Silicon as a Tool for Nanostructure Devices used in Optics, Biology, and Electronics-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Regular Dislocation Networks in Silicon as a Tool for Nanostructure Devices used in Optics, Biology, and Electronics

Published:2007-06-04 Issue:6 Volume:3 Page:964-973
ISSN:1613-6810
Container-title:Small
language:en
Short-container-title:Small

Author:

Kittler M.,Yu X.,Mchedlidze T.,Arguirov T.,Vyvenko O. F.,Seifert W.,Reiche M.,Wilhelm T.,Seibt M.,Voß O.,Wolff A.,Fritzsche W.

Publisher

Wiley

Subject

Biomaterials,Biotechnology,General Materials Science,General Chemistry

Reference53 articles.

1. Bilateral microscopy of dislocations and dislocation diodes in germanium

2. Impurity gettering by misfit dislocations in Si (2% Ge) epitaxy: nickel

3. Room-temperature silicon light-emitting diodes based on dislocation luminescence

Cited by 57 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Dislocations in Crystalline Silicon Solar Cells;Advanced Energy and Sustainability Research;2023-12-27

2. The Excitation Efficiency for Dislocation-Related Luminescence Centers in Silicon with Oxygen Precipitates;Semiconductors;2023-05

3. Recombination and Charge Collection at Nickel Silicide Precipitates in Silicon Studied by Electron Beam‐Induced Current;physica status solidi (b);2021-07-08

4. Combined DLTS/MCTS investigations of deep electrical levels of regular dislocation networks in silicon;Journal of Physics: Conference Series;2019-05-01

5. Dislocations as a boundary between charge density wave and oxygen rich phases in a cuprate high temperature superconductor;Superconductor Science and Technology;2017-02-06

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP