A new method for determining the thickness and composition of thin layers by electron probe microanalysis-Reference-Cited by-同舟云学术

A new method for determining the thickness and composition of thin layers by electron probe microanalysis

Published:1985-11 Issue:11 Volume:20 Page:1427-1433
ISSN:0232-1300
Container-title:Crystal Research and Technology
language:en
Short-container-title:Cryst. Res. Technol.

Author:

Hunger H.-J.,Baumann W.,Schulze S.

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Reference12 articles.

1. Quantitative electron probe microanalysis using Gaussian φ(ρz) Curves

2. : The Electron Microprobe New York, London, Sidney 1964, 217

3. : in: Mikroanalyse dünner Schichten und Schichtstrukturen 1982, Kongreß- und Tagungsberichte der Martin-Luther-Universität Halle-Wittenberg 1984/1 (015), Halle 1984, p. 26–36

4. Measurements of the electron backscattering coefficient for quantitative EPMA in the energy range of 4 to 40 keV

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