1. in Mikrochim. Acta, Suppl. IV, 252 (1970).
2. A versatile atomic number correction for electron-probe microanalysis
3. Proc. 3. Internat. Symp. X-Ray Optics and Microanalysis, Stanford 1962, Academic Press, New York 1963 (p. 379).
4. and , Proc. 4. Internat. Congr. X-Ray Optics and Microanalysis, Orsay 1965, Hermann, Paris 1966 (p. 240).