Affiliation:
1. School of Applied Sciences Kalinga Institute of Industrial Technology, KIIT‐DU Bhubaneswar Odisha India
2. Department of Applied Sciences ABV‐Indian Institute of Information Technology and Management Gwalior Gwalior Madhya Pradesh India
Abstract
AbstractSoftware reliability is one of the standard critical inherent characteristics of software systems. The testing coverage function (TCF) is a significant parameter for identifying the completeness and effectiveness of software testing. It is defined as the proportion of the code that has been tested up to time t. To capture the dynamic behavior of the number of faults detected over a period of time, several distributions, namely S‐shaped, inflection S‐shaped, logistic, log‐logistic, Weibull, Rayleigh, Erlang, and logarithmic exponentiated, have been used as TCF in literature. However, these distributions are not sufficient to describe TCF's practical behavior due to complexity and vagueness in the collected data. This study proposes two software reliability growth models (SRGMs), which incorporate the generalized inflection S‐shaped (GISS) distribution as TCF. The models have been developed in perfect and imperfect debugging environments while considering fault removal efficiency, error generation, and uncertainty in the operating environment. To analyze the effectiveness, the proposed models are then tested with six failure data sets. The choice of GISS distribution as a TCF improves the software reliability estimation in comparison with the existing models in the literature. Finally, single and multiple parameters sensitivity analysis also has been done and based on it, the critical parameters have been detected. The proposed models may be helpful for the system analyst to predict various parameters about some software systems.
Subject
Computer Networks and Communications,Hardware and Architecture
Cited by
8 articles.
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