Storing matter technique performed in the analytical chamber of a quadrupole SIMS analyser

Author:

Konarski P.1,Miśnik M.12,Zawada A.13,Brongersma H. H.4

Affiliation:

1. Institute of Tele and Radio Technology; Ratuszowa 11 03-450 Warszawa Poland

2. Gdańsk University of Technology; Narutowicza 11/12 80-952 Gdańsk Poland

3. Military University of Technology; Kaliskiego 2 00-908 Warszawa Poland

4. Eindhoven University of Technology; Eindhoven The Netherlands

Funder

National Centre for Research and Development, Poland

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Application of ‘Storing Matter’ technique in SIMS depth profile analysis;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2019-07

2. Metal oxide collectors for storing matter technique applied in secondary ion mass spectrometry;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2016-03

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