Metal oxide collectors for storing matter technique applied in secondary ion mass spectrometry-Reference-Cited by-同舟云学术

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Metal oxide collectors for storing matter technique applied in secondary ion mass spectrometry

Published:2016-03 Issue: Volume:371 Page:199-204
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Miśnik Maciej,Konarski Piotr^ORCID,Zawada Aleksander

Funder

National Centre for Research and Development

Ministry of Science and Higher Education

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference14 articles.

1. Sputtering by Particle Bombardment III;Yu,1991

2. Analysis of solids by secondary ion and sputtered neutral mass spectrometry;Gnaser;Appl. Phys. A,1985

3. Enveloppe Soleau No. 13852 deposited by Cameca on 04/05/1998 on behalf of G. Slodzian.

4. Storing Matter: a new quantitative and sensitive analytical technique based on sputtering and collection of sample material;Wirtz;Nucl. Instrum. Methods Phys. Res., Sect. B,2009

5. The Storing Matter technique: application to inorganic samples;Philipp;Appl. Surf. Sci.,2008

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Application of ‘Storing Matter’ technique in SIMS depth profile analysis;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2019-07

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