Caesium-ion-induced Auger emission from aluminium and silicon
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference26 articles.
1. and Secondary Ion Mass Spectroscopy, Wiley, New York (1987).
2. The Theory of Ionization Probability in Sputtering
3. in Secondary Ion Mass Spectrometry, SIMS-6, ed. by and p. 17, Wiley, Chichester (1988).
4. Experimental and theoretical approaches to the ionization process in secondary-ion emission
5. Molecular versus atomic secondary ion emission from solids
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