Take-off angle and film thickness dependences of the attenuation length of X-ray photoelectrons by a trajectory reversal method
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference18 articles.
1. Zur bestimmung der reduzierten dicke D/λ dünner Schichten mittels XPS
2. Electron mean‐free pathlengths through monolayers of cadmium arachidate
3. Relative intensities in X-ray photoelectron spectra
4. Comparison of electron attenuation lengths and escape depths with inelastic mean free paths
5. On the influence of elastic scattering on asymmetric xp-signal distribution
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