Inelastic mean-free path and mean escape depth of 10–140 eV electrons in SiO2 nanoparticles determined by Si 2p photoelectron yields

Author:

Antonsson E.1,Gerke F.1,Langer B.1,Goroncy C.1,Dresch T.2,Leisner T.23ORCID,Graf C.4ORCID,Rühl E.1ORCID

Affiliation:

1. Physical Chemistry, Freie Universität Berlin, Arnimallee 22, D-14195 Berlin, Germany

2. Institute of Meteorology and Climate Research, Karlsruhe Institut of Technology, – KIT Hermann-von-Helmholtz-Platz 1, D-76344 Eggenstein-Leopoldhafen, Germany

3. Institute of Environmental Physics, University of Heidelberg, Im Neuenheimer Feld 229, D-69120 Heidelberg, Germany

4. Fachbereich Chemie- und Biotechnologie, Hochschule Darmstadt – University of Applied Sciences, Stephanstr. 7, D-64295 Darmstadt, Germany

Abstract

We report on photoelectron spectra of SiO2 nanoparticles (d = 157 ± 6 nm) above the Si 2p threshold in the photon energy range 118–248 eV with electron kinetic energy 10–140 eV and analyze the photoelectron yield as a function of photon energy.

Funder

Bundesministerium für Bildung und Forschung

Publisher

Royal Society of Chemistry (RSC)

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3