General theoretical treatment of the angular dependence of critical depths in X-ray fluorescence spectroscopic studies of surfaces, thin films and multilayers-Reference-Cited by-同舟云学术

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General theoretical treatment of the angular dependence of critical depths in X-ray fluorescence spectroscopic studies of surfaces, thin films and multilayers

Published:1990-04 Issue:4 Volume:15 Page:235-244
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Scimeca T.,Andermann G.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference11 articles.

1. Surface-film and interfacial analysis via variable grazing exit angle x-ray fluorescence spectrometry

2. Multilayer thin film thickness determination with variable exit angle ultrasoft x-ray fluorescence spectrometry

3. Some fundamental aspects of surface-film analysis with variable angle ultrasoft x-ray fluorescence spectrometry

4. Surface-Film and Interfacial Analysis Via Variable Grazing Exit Angle X-Ray Fluorescence Spectrometry, Applied Surface Science (in press).

5. Principles of X-Ray Spectrometric Analysis, 2nd Ed, Plenum Press, New York (1975).

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Effects of surface roughness on surface analysis via soft and ultrasoft X-ray fluorescence spectroscopy;Applied Surface Science;2001-12

2. X‐Ray Absorption Study of Electrochemically Grown Oxide Films on Al‐Cr Sputtered Alloys: I . Ex situ Studies;Journal of The Electrochemical Society;1992-07-01

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