Multilayer thin film thickness determination with variable exit angle ultrasoft x-ray fluorescence spectrometry
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference14 articles.
1. New depth-profiling method by angular-dependent x-ray photoelectron spectroscopy
2. X-ray photoelectron study of thin evaporated films of Fe/Ni alloy
3. A comparison of SIMS with other techniques based on ion-beam solid interactions
4. Some fundamental aspects of surface-film analysis with variable angle ultrasoft x-ray fluorescence spectrometry
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. An Evaluation of the Variable-Exit-Angle Ultrasoft X-Ray Fluorescence Technique as Applied to Ni/Fe Thin-Film Multilayers;Applied Spectroscopy;1992-01
2. Recent Developments in Surface and Thin Film Analysis Using Low - Energy Electron Induced X - Ray Spectrometry (LEEIXS);Advances in X-Ray Analysis;1992
3. The characterization of the oxidation of Fe by variable exit angle ultrasoft x-ray fluorescence spectroscopy;Applied Surface Science;1991-11
4. Recent Developments in Surface and Thin Film Analysis using Low - Energy Electron Induced X-Ray Spectrometry (LEEIXS);Advances in X-ray Analysis;1991
5. General theoretical treatment of the angular dependence of critical depths in X-ray fluorescence spectroscopic studies of surfaces, thin films and multilayers;Surface and Interface Analysis;1990-04
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