Effects of surface roughness on surface analysis via soft and ultrasoft X-ray fluorescence spectroscopy
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference12 articles.
1. R. Muller, Spectrochemical Analysis by X-ray Fluorescence, Plenum Press, New York, 1972, pp. 79–83.
2. Surface analysis and angular distributions in x-ray photoelectron spectroscopy
3. Direct observation of surface-profile effects on X-ray-photoelectron angular distributions
4. Solid state—and surface—analysis by means oF angular-dependent x-ray photoelectron spectroscopy
5. Surface-film and interfacial analysis via variable grazing exit angle x-ray fluorescence spectrometry
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