Author:
von Criegern R.,Weitzel L.,Zeininger H.,Lange-Gieseler R.
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference13 articles.
1. Depth profiling by SIMS?depth resolution, dynamic range and sensitivity
2. Dynamic range of 106in depth profiling using secondary‐ion mass spectrometry
3. and Secondary Ion Mass Spectrometry, p. 793. Wiley, New York (1987).
4. and Secondary Ion Mass Spectrometry, pp. 534 and 603 Wiley, New York (1987).
5. (a) and Secondary Ion Mass Spectrometry, p. 518. Wiley, New York (1987);
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