An Ab Initio Study for Oxygen Adsorption Behavior on Polar GaN Surfaces

Author:

Akiyama Toru12ORCID,Kawamura Takahiro12ORCID

Affiliation:

1. Graduate School of Engineering Mie University 1577 Kurima‐Machiya Tsu 514‐8507 Japan

2. Innovation Center for Semiconductor and Digital Future Mie University 1577 Kurima‐Machiya Tsu 514‐8507 Japan

Abstract

Theoretical investigations for the adsorption behavior of O atoms on both Ga‐polar (+c) surface and N‐polar (c) GaN surfaces using ab initio calculations to clarify the influence of adsorption behavior on oxygen incorporation are presented. The calculations demonstrate that the O atom is stabilized by forming GaOH bond on the flat +c plane GaN(0001) surface, while the topmost N atom is replaced by the O atom on the flat c plane GaN(000) surface. The calculations using the nudged elastic band method also reveal that the energy barriers for oxygen incorporation on the flat c plane surface are comparable to that on the flat +c plane surface. Furthermore, the adsorption energy on the c plane surface drastically increases on the vicinal surface with step edges and kinks, indicating that step edges and kinks enhance the incorporation of O atoms on the c plane surfaces. The calculated results offer better understanding of the atom‐scale mechanisms for the orientation dependence of oxygen concentrations in GaN.

Funder

Kyushu University

Publisher

Wiley

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