Preparation of (InGa)As/GaAs materials for TEM by one side non-rotation ion beam thinning
Author:
Publisher
Wiley
Subject
Anatomy
Reference27 articles.
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1. Thin foil preparation of metal particles in brittle ceramic matrices;Microscopy Research and Technique;1996-11-01
2. Thin foil preparation for AEM study of small metal particles in stony meteorites;Proceedings, annual meeting, Electron Microscopy Society of America;1995-08-13
3. Interfacial Microstructure of InxGa1-xAs/GaAs Strained Layers;Materials Science Forum;1995-07
4. Microstructures and critical thicknesses of InxGa1-xAs/GaAs strained-layer structures;Semiconductor Science and Technology;1994-05-02
5. Topography development on the surface of a semiconductor heterostructure under Ar+ ion-beam milling;Applied Surface Science;1993-12
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