Technique for preparing cross-section transmission electron microscope specimens from ion-irradiated ceramics-Reference-Cited by-同舟云学术

Technique for preparing cross-section transmission electron microscope specimens from ion-irradiated ceramics

Published:1991-12 Issue:4 Volume:19 Page:452-460
ISSN:0741-0581
Container-title:Journal of Electron Microscopy Technique
language:en
Short-container-title:J. Elec. Microsc. Tech.

Author:

Zinkle S. J.,Haltom C. P.,Jenkins L. C.,DuBose C. K. H.

Publisher

Wiley

Subject

Anatomy

Reference16 articles.

1. Cross‐sectional specimens for transmission electron microscopy

2. Thin foils of non-metals made for electron microscopy by sputter-etching

3. The preparation of cross-section specimens for transmission electron microscopy

4. (1986) TEM/STEM sample preparation for the investigation of solid state structures. In: Mat. Res. Soc. Symp. Proc. Vol. 62. et al., eds. Materials Research Society: Pittsburgh, pp. 105-112.

5. The influence of helium doping on the damage microstructure of heavy-ion irradiated α-Al2O3

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