Surface Defect Passivation of Silicon Micropillars-Reference-Cited by-同舟云学术

Surface Defect Passivation of Silicon Micropillars

Published:2018-08-15 Issue:20 Volume:5 Page:1800865
ISSN:2196-7350
Container-title:Advanced Materials Interfaces
language:en
Short-container-title:Adv. Mater. Interfaces

Author:

Mikulik Dmitry¹^ORCID,Meng Andrew C.²^ORCID,Berrazouane Riad¹,Stückelberger Josua³^ORCID,Romero‐Gomez Pablo¹^ORCID,Tang Kechao²^ORCID,Haug Franz‐Josef³,Fontcuberta i Morral Anna¹^ORCID,McIntyre Paul C.²

Affiliation:

1. Laboratory of Semiconductor Materials Institute of Materials Ecole Polytechnique Fédérale de Lausanne Lausanne 1015 Switzerland

2. Department of Materials Science and Engineering Stanford University Stanford CA 94305 USA

3. Photovoltaics and Thin Film Electronics Laboratory Institute of Microengineering Ecole Polytechnique Fédérale de Lausanne Neuchâtel 2000 Switzerland

Funder

Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung

National Science Foundation

H2020 Marie Skłodowska-Curie Actions

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/admi.201800865

Reference53 articles.

1. Black silicon solar cells with interdigitated back-contacts achieve 22.1% efficiency