Accurate Quantification of Si/SiGe Interface Profiles via Atom Probe Tomography
Author:
Affiliation:
1. Oak Ridge National Laboratory; Oak Ridge TN 37831 USA
2. HRL Laboratories, LLC; 3011 Malibu Canyon Rd. Malibu CA 90265 USA
Publisher
Wiley
Subject
Mechanical Engineering,Mechanics of Materials
Reference39 articles.
1. Strained p-Channel FinFETs With Extended $\Pi$-Shaped Silicon–Germanium Source and Drain Stressors
2. Room temperature operation of epitaxially grown Si/Si0.5Ge0.5/Si resonant interband tunneling diodes
3. Near and mid infrared silicon/germanium based photodetection
4. Coherent singlet-triplet oscillations in a silicon-based double quantum dot
5. Intersubband Electroluminescence from Silicon-Based Quantum Cascade Structures
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