In Situ Characterization of Interfaces Relevant for Efficient Photoinduced Reactions-Reference-Cited by-同舟云学术

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In Situ Characterization of Interfaces Relevant for Efficient Photoinduced Reactions

Published:2017-10-10 Issue:21 Volume:4 Page:1601118
ISSN:2196-7350
Container-title:Advanced Materials Interfaces
language:en
Short-container-title:Adv. Mater. Interfaces

Author:

Supplie Oliver¹,May Matthias M.²,Brückner Sebastian¹,Brezhneva Nadzeya³,Hannappel Thomas¹,Skorb Ekaterina V.³

Affiliation:

1. Institute for Physics; Technical University Ilmenau; 98693 Ilmenau Germany

2. Department of Chemistry; University of Cambridge; Cambridge CB2 1EW UK

3. Laboratory of Solution Chemistry of Advanced Materials and Technologies (SCAMT); ITMO University; 197101 St. Petersburg Russian Federation

Funder

Deutsche Forschungsgemeinschaft

German National Academy of Sciences Leopoldina

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials

Reference471 articles.

1. Nobel Lecture: Quasielectric fields and band offsets: teaching electrons new tricks

2. Real-time optical diagnostics for epitaxial growth

3. Optical characterisation of semiconductor surfaces and interfaces

4. Characterization of epitaxial semiconductor growth by reflectance anisotropy spectroscopy and ellipsometry

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