TXRF intensity dependence on position of dried residue on sample carrier and TXRF determination of halogen in liquid samples
Author:
Affiliation:
1. Graduate School of Engineering; Osaka City University; 3-3-138 Sugimoto, Sumiyoshi Osaka 558-8585 Japan
Publisher
Wiley
Subject
Spectroscopy
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/xrs.2688/fullpdf
Reference18 articles.
1. Applications of total reflection X-ray fluorescence spectrometry in trace element and surface analysis
2. Total reflection X-ray fluorescence: A technique for trace element analysis in materials
3. Status of trace and toxic elements pollution in creek ecosystem using TXRF method
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