Total reflection X-ray fluorescence: A technique for trace element analysis in materials
Author:
Publisher
Elsevier BV
Subject
Condensed Matter Physics,General Materials Science
Reference19 articles.
1. Optical Flats for Use in X‐Ray Spectrochemical Microanalysis
2. Total-reflection x-ray fluorescence spectrometric determination of elements in nanogram amounts
3. Total Reflection X-ray Fluorescence Analysis;Klockenkaemper,1996
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