Depth sensitive X-ray diffraction as a probe of buried half-metallic inclusions
Author:
Affiliation:
1. Department of Physics; University of Warwick; Coventry CV4 7AL UK
Funder
EPSRC (UK)
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference26 articles.
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4. Molecular Beam Epitaxy of Co2MnSi Films on Group-IV Semiconductors
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4. Growth and characterisation of MnSb(0 0 0 1)/InGaAs(1 1 1)A epitaxial films;Journal of Crystal Growth;2018-09
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