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A computer program to illustrate macro topography on electron backscattering

  • Published:1996-09 Issue:6 Volume:18 Page:428-432
  • ISSN:0161-0457
  • Container-title:Scanning
  • language:en
  • Short-container-title:Scanning

Author:

Howell P. G. T.

Publisher

Wiley

Subject

Instrumentation,Atomic and Molecular Physics, and Optics

Reference27 articles.

1. Nat Acad Sci Natl Res Council Publ. 1133;Berger,1964

2. Special publication. 460;Bishop,1976

3. Electron- specimen interactions in low voltage scanning electron microscopy;Bongeler;Scanning,1993

4. Electron strategies for SEM of macroporous solids: Rose-tinted views through osteoporotic bone;Boyde;Scanning,1995

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Monte Carlo study of the influence of electron beam focusing to SEM linewidth measurement;Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences;2013-05-29

2. Monte Carlo simulation of secondary electron images for real sample structures in scanning electron microscopy;Scanning;2011-09-15

3. Application of Monte Carlo simulation to SEM image contrast of complex structures;Surface and Interface Analysis;2005

4. Monte Carlo simulation of electron backscattering from compounds with low mean atomic number;Scanning;1998-01

5. Scanning electron microscopy for materials characterization;Current Opinion in Solid State and Materials Science;1997-08
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