Use of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscope-Reference-Cited by-同舟云学术

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Use of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscope

Published:2006-01 Issue:1 Volume:28 Page:27-31
ISSN:0161-0457
Container-title:Scanning
language:en
Short-container-title:Scanning

Author:

Wells O. C.,Gignac L. M.,Murray C. E.,Frye A.,Bruley J.

Publisher

Wiley

Subject

Instrumentation,Atomic and Molecular Physics, and Optics

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/sca.4950280105/fullpdf

Reference16 articles.

1. Fast orientation imaging;Dingley;Microsc Today,2002

2. Fathers DJ Joy DC Jakubovics JP Scanning electron microscope type II magnetic contrast Proc 8th Int Conf Canberra 630 631 1974

3. A comparison of grain size measurements in Al-Cu thin films: Imaging versus diffraction techniques;Gignac;Microsc Today,2002

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