Author:
Dingley David J.,Wright Stuart,Nowell Mathew
Abstract
Orientation Imaging Microscopy is currently the most rapidly growing combined metallographic and crystallographic technique today. The first OIM was recorded by Wright in 1991, and published soon after, Adams et al. (1993). The technique is based on the original works on Electron Backscatter Diffraction (EBSD) by Venables and Hariand (1973), and Dingiey (1984, 1987). By 1994 some number of papers on the subject had been published. At the time of writing the authors are aware of over 600 publications that have utilized the technique and there are in excess of 400 systems in use worldwide.
Publisher
Cambridge University Press (CUP)
Reference8 articles.
1. Orientation imaging: The emergence of a new microscopy
2. On-line determination of crystal orientation and texture determination in an SEM;Dingley;Proceedings of the Royal Microscopic Society,1984
3. Electron back-scattering patterns—A new technique for obtaining crystallographic information in the scanning electron microscope
4. On-line Analysis of Electron Backscatter Diffraction Patterns, Texture Analysis of Polysilicon;Dingley;Scanning Electron Microscopy,1987
5. Image Processing Procedures for Analysis of Electron Back Scattering Patterns;Krieger Lassen;Scanning Microscopy,1992
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献