An EBSD camera as a tool to characterise in-plane magnetisation vectors on Fe-Si (001) surface-Reference-Cited by-同舟云学术

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An EBSD camera as a tool to characterise in-plane magnetisation vectors on Fe-Si (001) surface

Published:2023-08 Issue: Volume:250 Page:113754
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Tanaka Tomohito^ORCID,Kawakami Kazuto,Mogi Hisashi,Arai Satoshi

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference40 articles.

1. Advanced Scanning Electron Microscopy and X-ray Microanalysis,1986

2. Electron Backscatter Diffraction in Materials Science,2009

3. 1st Nat. Conf: on Electron Probe Microanalysis, Maryland, U.S.A.;Dorsey,1966

4. Effets de contraste cristallin en microscopie electronique a balayage;Philibert;Micron,1969

5. The direct observation of domain structure and magnetic fields in the scanning electron microscope;Banbury;J. Sci. Instrum.,1967

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