Tackling Challenges in Seebeck Coefficient Measurement of Ultra‐High Resistance Samples with an AC Technique-Reference-Cited by-同舟云学术

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Tackling Challenges in Seebeck Coefficient Measurement of Ultra‐High Resistance Samples with an AC Technique

Published:2020-01-15 Issue:3 Volume:6 Page:1901340
ISSN:2199-160X
Container-title:Advanced Electronic Materials
language:en
Short-container-title:Adv. Electron. Mater.

Author:

Pan Zhenyu¹,Zhu Zheng¹,Wilcox Jonathon²,Urban Jeffrey J.³,Yang Fan⁴,Wang Heng¹^ORCID

Affiliation:

1. Department of Mechanical, Materials, and Aerospace EngineeringIllinois Institute of Technology Chicago IL 60616 USA

2. Department of Chemical EngineeringIllinois Institute of Technology Chicago IL 60616 USA

3. The Molecular FoundryLawrence Berkeley National Laboratory Berkeley CA 94720 USA

4. Department of Mechanical EngineeringStevens Institute of Technology Hoboken NJ 07030 USA

Publisher

Wiley

Subject

Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/aelm.201901340

Reference37 articles.

1. Reliable measurement of Seebeck coefficient in semiconductors

2. CRC Handbook of Thermoelectrics

3. Complex thermoelectric materials

4. Enhancement of Thermoelectric Efficiency in PbTe by Distortion of the Electronic Density of States

5. Polarization-Induced Hole Doping in Wide–Band-Gap Uniaxial Semiconductor Heterostructures

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1. Exploring electrical transport in thin film and bulk thermoelectric materials with an automated Seebeck coefficient and resistivity measurement platform;Measurement;2024-08

2. The Potential of Tellurene‐Like Nanosheets as a Solution‐Processed Room‐Temperature Thermoelectric Material;Small Science;2024-03-31

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