Efficient multi-threshold voltage techniques for minimum leakage current in nanoscale technology-Reference-Cited by-同舟云学术

Efficient multi-threshold voltage techniques for minimum leakage current in nanoscale technology

Published:2010-07-14 Issue:10 Volume:39 Page:1049-1066
ISSN:0098-9886
Container-title:International Journal of Circuit Theory and Applications
language:en
Short-container-title:Int. J. Circ. Theor. Appl.

Author:

Rjoub Abdoul,Al-Ajlouni Motasem

Publisher

Wiley

Subject

Applied Mathematics,Electrical and Electronic Engineering,Computer Science Applications,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/cta.686/fullpdf

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4. Analytical yield prediction considering leakage/performance correlation;Rao;IEEE Transactions on CAD,2006

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