Molecular dynamic-secondary ion mass spectrometry (D-SIMS) ionized by co-sputtering with C60 + and Ar+-Reference-Cited by-同舟云学术

Molecular dynamic-secondary ion mass spectrometry (D-SIMS) ionized by co-sputtering with C60 + and Ar+

Published:2011-09-06 Issue:19 Volume:25 Page:2897-2904
ISSN:0951-4198
Container-title:Rapid Communications in Mass Spectrometry
language:en
Short-container-title:Rapid Commun. Mass Spectrom.

Author:

You Yun-Wen¹,Chang Hsun-Yun¹,Lin Wei-Chun¹,Kuo Che-Hung²,Lee Szu-Hsian²,Kao Wei-Lun²,Yen Guo-Ji²,Chang Chi-Jen²,Liu Chi-Ping¹,Huang Chih-Chieh²,Liao Hua-Yang¹,Shyue Jing-Jong¹²

Affiliation:

1. Research Center for Applied Sciences; Academia Sinica; Taipei 115 Taiwan

2. Department of Materials Science and Engineering; National Taiwan University; Taipei 106 Taiwan

Funder

Academia Sinica and the Taiwan National Science Council

Publisher

Wiley

Subject

Organic Chemistry,Spectroscopy,Analytical Chemistry

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/rcm.5181/fullpdf

Reference39 articles.

1. Effects of primary ion polyatomicity and kinetic-energy on secondary ion yield and internal energy in SIMS;Hand;Int. J. Mass Spectrom. Ion Processes,1990

2. Impact of slow gold clusters on various solids - nonlinear effects in secondary ion emission;Benguerba;Nucl. Instrum. Methods Phys. Res., Sect. B,1991

3. Secondary-ion emission under cluster-impact at low energies (5-60 keV) - influence of the number of atoms in the projectile;Boussofianebaudin;Nucl. Instrum. Methods Phys. Res., Sect. B,1994

4. Cluster primary ion bombardment of organic materials;Kollmer;Appl. Surf. Sci.,2004

5. Orthogonal time-of-flight secondary ion mass spectrometric analysis of peptides using large gold clusters as primary ions;Tempez;Rapid Commun. Mass Spectrom.,2004

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Soft Ion Sputtering of PAni Studied by XPS, AFM, TOF-SIMS, and STS;Coatings;2020-10-12

2. Recent advances in single-cell analysis by mass spectrometry;The Analyst;2019

3. Gas-cluster ion sputtering: Effect on organic layer morphology;Journal of Vacuum Science & Technology A;2018-09

4. Improvement of the gas cluster ion beam-(GCIB)-based molecular secondary ion mass spectroscopy (SIMS) depth profile with O2+ cosputtering;The Analyst;2016

5. Rapid label-free determination of ketamine in whole blood using secondary ion mass spectrometry;Talanta;2015-10