Ion sputtering in the surface analysis of practical surfaces
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference8 articles.
1. and Ion Bombardment of Solids, Heinemann, London (1968).
2. The development of surface shape during sputter-depth profiling in Auger electron spectroscopy
3. Prediction of ion-bombarded surface topographies using Frank's kinematic theory of crystal dissolution
4. Evolution of well-defined surface contour submitted to ion bombardment: computer simulation and experimental investigation
5. The frictional behaviour of iron and iron-chromium alloys at elevated temperatures
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1. Depth and interface resolution in CdS/CuInSe2 heterostructures;Solar Cells;1990-04
2. Surface Microanalysis and Microscopy by X-Ray Photoelectron Spectroscopy (XPS), Core-Loss Spectroscopy (CLS) and Auger Electron Spectroscopy (AES);Surface and Interface Characterization by Electron Optical Methods;1988
3. Superposition of Auger electron spectroscopy depth profiles obtained on Cr/Ni multilayer samples with different roughnesses;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1987-07
4. Depth resolution improvement in AES sputter profiling of Ni/Cr multilayers on rough substrates using two ion beams;Surface and Interface Analysis;1987-02
5. Corrosion Behavior of Laser‐Surface Melted and Laser‐Surface Alloyed Steels;Journal of The Electrochemical Society;1986-06-01
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