The development of surface shape during sputter-depth profiling in Auger electron spectroscopy
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference25 articles.
1. Experimental investigation of the sputter-topographic evaluation of a cylindrical surface
2. Microtopography of surfaces eroded by ion-bombardment
3. and Ion Bombardment of Solids. Heinemann, London (1968).
4. The development of surface topography during depth profiling in auger electron spectroscopy
5. Prediction of ion-bombarded surface topographies using Frank's kinematic theory of crystal dissolution
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1. Sputter depth profile analysis of interfaces;Reports on Progress in Physics;1998-07-01
2. Compositional depth profiling by sputtering;Progress in Surface Science;1991-01
3. On the development of increasing surface roughness during ion sputtering;Thin Solid Films;1987-08
4. Practical surface analysis: state of the art and recent developments in AES, XPS, ISS and SIMS;Surface and Interface Analysis;1986-07
5. An XPS study of the angular dependence of preferential sputtering and ion-induced reduction in lead oxide-containing glasses;Vacuum;1984-06
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