Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference11 articles.
1. The depth dependence of the depth resolution in composition-depth profiling with Auger Electron Spectroscopy
2. Quantitative depth profiling in surface analysis: A review
3. in: Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy, Chapter 4, pp. 141-180 ed. by and Wiley (1983).
4. and in: Thin Film and Depth Profile Analysis, Chapter 7, pp. 141-158 ed. by Topics in Current Physics Vol. 37, Springer-Verlag (1984).
5. Proc. 7th Intern. Vac. Congr. A. 3rd Intern. Conf. Solid Surface, Berger, Vienna 1977, Vol. III, pp. 2613,
Cited by
54 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献