Nanoscale Topotactic Phase Transformation in SrFeO x Epitaxial Thin Films for High‐Density Resistive Switching Memory-Reference-Cited by-同舟云学术

Nanoscale Topotactic Phase Transformation in SrFeO x Epitaxial Thin Films for High‐Density Resistive Switching Memory

Published:2019-10-22 Issue:49 Volume:31 Page:1903679
ISSN:0935-9648
Container-title:Advanced Materials
language:en
Short-container-title:Adv. Mater.

Author:

Tian Junjiang¹²,Wu Haijun³^ORCID,Fan Zhen¹²,Zhang Yang³,Pennycook Stephen J.³^ORCID,Zheng Dongfeng¹,Tan Zhengwei¹,Guo Haizhong⁴,Yu Pu⁵,Lu Xubing¹,Zhou Guofu²⁶,Gao Xingsen¹,Liu Jun‐Ming¹⁷

Affiliation:

1. Institute for Advanced MaterialsSouth China Academy of Advanced OptoelectronicsSouth China Normal University Guangzhou 510006 China

2. Guangdong Provincial Key Laboratory of Optical Information Materials and TechnologySouth China Academy of Advanced OptoelectronicsSouth China Normal University Guangzhou 510006 China

3. Department of Materials Science and EngineeringNational University of Singapore Singapore 117575 Singapore

4. School of Physical EngineeringZhengzhou University Zhengzhou 450001 China

5. State Key Laboratory of Low Dimensional Quantum Physics and Department of PhysicsTsinghua University Beijing 100084 China

6. National Center for International Research on Green OptoelectronicsSouth China Normal University Guangzhou 510006 China

7. Laboratory of Solid State Microstructures and Innovation Center of Advanced MicrostructuresNanjing University Nanjing 210093 China

Funder

National Natural Science Foundation of China

Natural Science Foundation of Guangdong Province

Ministry of Education - Singapore

Publisher

Wiley

Subject