Probing Distinctive Electron Conduction in Multilayer Rhenium Disulfide-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Probing Distinctive Electron Conduction in Multilayer Rhenium Disulfide

Published:2018-12-13 Issue: Volume: Page:1805860
ISSN:0935-9648
Container-title:Advanced Materials
language:en
Short-container-title:Adv. Mater.

Author:

Lee Byung Chul¹,Na Junhong²,Choi Jun Hee³,Ji Hyunjin²,Kim Gyu‐Tae¹,Joo Min‐Kyu⁴^ORCID

Affiliation:

1. School of Electrical EngineeringKorea University Seoul 02841 Republic of Korea

2. Department of Energy ScienceSungkyunkwan University Suwon 16419 Republic of Korea

3. Department of PhysicsEwha Womans University Seoul 03760 Republic of Korea

4. Department of Applied PhysicsSookmyung Women's University Seoul 04310 Republic of Korea

Funder

Agency for Defense Development

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/adma.201805860

Reference42 articles.

1. Electric Field Effect in Atomically Thin Carbon Films

2. Single-layer MoS2 transistors

3. Black phosphorus field-effect transistors

4. Van der Waals heterostructures and devices

5. 2D materials and van der Waals heterostructures

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The increase of the scattering at high electric fields in Multilayer ReS2 FETs: output characteristics and 1/f noise;Journal of Physics and Chemistry of Solids;2024-09

2. Negative Differential Interlayer Resistance in WSe₂ Multilayers via Conducting Channel Migration with Vertical Double-Side Contacts;ACS Applied Materials & Interfaces;2023-12-05

3. Enhanced Interlayer Charge Injection Efficiency in 2D Multilayer ReS₂ via Vertical Double-Side Contacts;ACS Applied Materials & Interfaces;2023-05-03

4. Persistent and reliable electrical properties of ReS2 FETs using PMMA encapsulation;Current Applied Physics;2023-04

5. High Temperature Carrier Scattering Mechanisms in Multilayer ReS₂ Field-Effect Transistors;Applied Science and Convergence Technology;2022-07-30

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3