Charge-Trapping-Induced Non-Ideal Behaviors in Organic Field-Effect Transistors-Reference-Cited by-同舟云学术

Charge-Trapping-Induced Non-Ideal Behaviors in Organic Field-Effect Transistors

Published:2018-03-25 Issue:18 Volume:30 Page:1800017
ISSN:0935-9648
Container-title:Advanced Materials
language:en
Short-container-title:Adv. Mater.

Author:

Un Hio-Ieng¹,Cheng Peng²,Lei Ting³,Yang Chi-Yuan¹,Wang Jie-Yu¹,Pei Jian¹^ORCID

Affiliation:

1. Beijing National Laboratory for Molecular Sciences (BNLMS); Key Laboratory of Bioorganic Chemistry and Molecular Engineering of Ministry of Education; Key Laboratory of Polymer Chemistry and Physics of Ministry of Education; Center of Soft Matter Science and Engineering; College of Chemistry and Molecular Engineering; Peking University; Beijing 100871 China

2. Department of Mechanical Engineering; State Key Laboratory of Tribology; Tsinghua University; Beijing 100084 China

3. Department of Chemical Engineering; Stanford University; Stanford CA 94305 USA

Funder

Major State Basic Research Development Program

Ministry of Science and Technology of the People's Republic of China

National Key R&D Program of China

National Natural Science Foundation of China

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

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