Contribution of dislocations to carrier recombination and transport in highly excited ELO and HVPE GaN layers
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference12 articles.
1. Characterization of differently grown GaN epilayers by time-resolved four-wave mixing technique
2. Application of picosecond four‐wave mixing and photoluminescence techniques for investigation of carrier dynamics in bulk crystals and heterostructures of GaN
3. Carrier diffusion and recombination in highly excited InGaN/GaN heterostructures
4. Transients of Carrier Recombination and Diffusion in Highly Excited GaN Studied by Photoluminescence and Four-Wave Mixing Techniques
5. Migration enhanced MOCVD (MEMOCVD TM ) buffers for increased carrier lifetime in GaN and AlGaN epilayers on sapphire and SiC substrate
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