X-ray production as a function of depth for low electron energies-Reference-Cited by-同舟云学术

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X-ray production as a function of depth for low electron energies

Published:1976-01 Issue:1 Volume:5 Page:36-40
ISSN:0049-8246
Container-title:X-Ray Spectrometry
language:en
Short-container-title:X-Ray Spectrom.

Author:

Brown J. D.,Parobek L.

Publisher

Wiley

Subject

Spectroscopy

Reference12 articles.

1. Sur les bases physiques de l'analyse ponctuelle par spectrographie X

2. Electron Probe Microanalysis

3. and in X-Ray Optics and Microanalysis, Hermann, Paris, 1966, p. 120.

4. and Proceedings of the 6th International Conference on X-Ray Optics and Microanalysis, University Press, Tokyo, 1972, p. 163.

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