Application of soft x-ray emission spectroscopy for the study of solid-phase reactions in Si-based interfaces-Reference-Cited by-同舟云学术

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Application of soft x-ray emission spectroscopy for the study of solid-phase reactions in Si-based interfaces

Published:2002 Issue:3 Volume:31 Page:203-208
ISSN:0049-8246
Container-title:X-Ray Spectrometry
language:en
Short-container-title:X-Ray Spectrom.

Author:

Galakhov V. R.

Publisher

Wiley

Subject

Spectroscopy

Reference38 articles.

1. Sur les bases physiques de l'analyse ponctuelle par spectrographie X

2. In Band Structure Spectroscopy of Metals and Alloys, (eds). Academic Press: London, 1973; 713.

3. Zur Tiefenverteilung der durch Elektronenstoß angeregten charakteristischen Röntgenstrahlung von Bor, Kohlenstoff, Aluminium und Silber

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigation of the thermal stability of Mg/Co periodic multilayers for EUV applications;Applied Physics A;2011-12-06

2. Characterization of EUV periodic multilayers;X-Ray Spectrometry;2011-07-26

3. Development and Interfacial Characterization of Co/Mg Periodic Multilayers for the EUV Range;The Journal of Physical Chemistry C;2010-03-19

4. Ultrasoft X-ray spectroscopy with variation of the electron excitation energy as a method for analyzing thin films and solid/solid interfaces;Bulletin of the Russian Academy of Sciences: Physics;2009-07

5. Formation of silicides in annealed periodic multilayers;SPIE Proceedings;2009-05-07

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